Documents disponibles écrits par cet auteur

X-ray diffraction procedures / Harold P. Klug ; Leroy Elbert Alexander

Public ISBD Titre : X-ray diffraction procedures : for polycrystalline and amorrphous materials Type de document : texte imprimé Auteurs : Harold P. Klug, Auteur ; Leroy Elbert Alexander, Auteur Mention d'édition : 2 éd Editeur : New York : Wiley Année de publication : 1974 Importance : 966 p. Format : 24 cm ISBN/ISSN/EAN : 978-0-471-49369-3 Note générale : Bipliogr. en fin de chapitre. Index p. 901-966 Langues : Anglais (eng) Mots-clés : X-rays  --  Diffraction. Index. décimale : 537.5.531 Résumé : The book is the outgrowth of more than twenty-five years of research and graduate teaching in the field of X-ray diffraction, a varied industrial consulting experience, and wide application of the technique to the researches and problems of the eighty industrial fellowships at mellon institute. The book assumes no special knowledge of crystallography and X-rays on the part of the reader, but gives at the beginning sufficient introductions to these sciences that the novice in diffraction may rather quickly understand and apply the simpler techniques. In keeping with the title, the fundamental equations of diffraction theory have not as a general rule been developed but have been taken from the previous literature. Note de contenu : Au sommaire : - Elementary crystallography. - The production and properties of X-rays. - Fundamental principles of X-ray diffraction. - Photographic powder techniques. - Diffractometric powder technique. - The interpretation of powder diffraction data. - Qualitative and quantitative analysis of crystalline powders. - The precision determination of lattice constants. - Crystallite size and lattice strains from line broadening. - Investigation of preferred orientation and texture. - Stress measurement in metals. - Radial-distribution studies of noncrystalline materials X-ray diffraction procedures : for polycrystalline and amorrphous materials [texte imprimé] / Harold P. Klug, Auteur ; Leroy Elbert Alexander, Auteur  . -  2 éd . - New York : Wiley, 1974 . - 966 p. ; 24 cm. ISBN : 978-0-471-49369-3 Bipliogr. en fin de chapitre. Index p. 901-966 Langues : Anglais (eng) Mots-clés : X-rays  --  Diffraction. Index. décimale : 537.5.531 Résumé : The book is the outgrowth of more than twenty-five years of research and graduate teaching in the field of X-ray diffraction, a varied industrial consulting experience, and wide application of the technique to the researches and problems of the eighty industrial fellowships at mellon institute. The book assumes no special knowledge of crystallography and X-rays on the part of the reader, but gives at the beginning sufficient introductions to these sciences that the novice in diffraction may rather quickly understand and apply the simpler techniques. In keeping with the title, the fundamental equations of diffraction theory have not as a general rule been developed but have been taken from the previous literature. Note de contenu : Au sommaire : - Elementary crystallography. - The production and properties of X-rays. - Fundamental principles of X-ray diffraction. - Photographic powder techniques. - Diffractometric powder technique. - The interpretation of powder diffraction data. - Qualitative and quantitative analysis of crystalline powders. - The precision determination of lattice constants. - Crystallite size and lattice strains from line broadening. - Investigation of preferred orientation and texture. - Stress measurement in metals. - Radial-distribution studies of noncrystalline materials

Exemplaires

Code-barres	Cote	Support	Localisation	Section	Disponibilité	Etat_Exemplaire
038217	537.5.531 KLU	Papier	Bibliothèque Centrale	Physique	Disponible
038216	537.5.531 KLU	Papier	Bibliothèque Centrale	Physique	Disponible	En bon état
038218	537.5.531 KLU	Papier	Bibliothèque Centrale	Physique	Disponible	En bon état