| Titre : |
X-ray diffraction procedures : for polycrystalline and amorrphous materials |
| Type de document : |
texte imprimé |
| Auteurs : |
Harold P. Klug, Auteur ; Leroy Elbert Alexander, Auteur |
| Mention d'édition : |
2 éd |
| Editeur : |
New York : John Wiley & Sons |
| Année de publication : |
1974 |
| Importance : |
966 p. |
| Format : |
24 cm |
| ISBN/ISSN/EAN : |
978-0-471-49369-3 |
| Note générale : |
Bipliogr. en fin de chapitre. Index p. 901-966 |
| Langues : |
Anglais (eng) |
| Mots-clés : |
X-rays -- Diffraction. |
| Index. décimale : |
537.5.531 |
| Résumé : |
The book is the outgrowth of more than twenty-five years of research and graduate teaching in the field of X-ray diffraction, a varied industrial consulting experience, and wide application of the technique to the researches and problems of the eighty industrial fellowships at mellon institute. The book assumes no special knowledge of crystallography and X-rays on the part of the reader, but gives at the beginning sufficient introductions to these sciences that the novice in diffraction may rather quickly understand and apply the simpler techniques. In keeping with the title, the fundamental equations of diffraction theory have not as a general rule been developed but have been taken from the previous literature. |
| Note de contenu : |
Au sommaire :
- Elementary crystallography.
- The production and properties of X-rays.
- Fundamental principles of X-ray diffraction.
- Photographic powder techniques.
- Diffractometric powder technique.
- The interpretation of powder diffraction data.
- Qualitative and quantitative analysis of crystalline powders.
- The precision determination of lattice constants.
- Crystallite size and lattice strains from line broadening.
- Investigation of preferred orientation and texture.
- Stress measurement in metals.
- Radial-distribution studies of noncrystalline materials |
X-ray diffraction procedures : for polycrystalline and amorrphous materials [texte imprimé] / Harold P. Klug, Auteur ; Leroy Elbert Alexander, Auteur . - 2 éd . - New York : John Wiley & Sons, 1974 . - 966 p. ; 24 cm. ISBN : 978-0-471-49369-3 Bipliogr. en fin de chapitre. Index p. 901-966 Langues : Anglais ( eng)
| Mots-clés : |
X-rays -- Diffraction. |
| Index. décimale : |
537.5.531 |
| Résumé : |
The book is the outgrowth of more than twenty-five years of research and graduate teaching in the field of X-ray diffraction, a varied industrial consulting experience, and wide application of the technique to the researches and problems of the eighty industrial fellowships at mellon institute. The book assumes no special knowledge of crystallography and X-rays on the part of the reader, but gives at the beginning sufficient introductions to these sciences that the novice in diffraction may rather quickly understand and apply the simpler techniques. In keeping with the title, the fundamental equations of diffraction theory have not as a general rule been developed but have been taken from the previous literature. |
| Note de contenu : |
Au sommaire :
- Elementary crystallography.
- The production and properties of X-rays.
- Fundamental principles of X-ray diffraction.
- Photographic powder techniques.
- Diffractometric powder technique.
- The interpretation of powder diffraction data.
- Qualitative and quantitative analysis of crystalline powders.
- The precision determination of lattice constants.
- Crystallite size and lattice strains from line broadening.
- Investigation of preferred orientation and texture.
- Stress measurement in metals.
- Radial-distribution studies of noncrystalline materials |
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