Documents disponibles dans la collection

CMOS Biotechnology / Lee, Hakho

Public ISBD Titre : CMOS Biotechnology Type de document : document électronique Auteurs : Lee, Hakho, Auteur ; Ham, Donhee, Auteur Editeur : Berlin : Springer Année de publication : 2007 Collection : Series on integrated circuits and systems ISBN/ISSN/EAN : 978-0-387-68913-5 Langues : Anglais (eng) Mots-clés : Biotechnologie  MOS  complémentaires  Dispositifs  optoélectroniques Index. décimale : 631.147 Biotechnologie. Agriculture biologique (alternative, écologique, utilisant des technologies propres) Résumé : CMOS Optical Sensors Bioanalytical instruments have been miniaturized on ICs to study various biophenomena or to actuate biosystems. These bio-lab-on-IC systems utilize the IC to facilitate faster, repeatable, and standardized biological experiments at low cost with a small volume of biological sample. CMOS Biotechnology will interest electrical engineers, bioengineers, biophysicists as well as researchers in MEMS, bioMEMS, microelectronics, microfluidics, and circuits and systems. CMOS Biotechnology [document électronique] / Lee, Hakho, Auteur ; Ham, Donhee, Auteur . - Springer, 2007. - (Series on integrated circuits and systems) . ISBN : 978-0-387-68913-5 Langues : Anglais (eng) Mots-clés : Biotechnologie  MOS  complémentaires  Dispositifs  optoélectroniques Index. décimale : 631.147 Biotechnologie. Agriculture biologique (alternative, écologique, utilisant des technologies propres) Résumé : CMOS Optical Sensors Bioanalytical instruments have been miniaturized on ICs to study various biophenomena or to actuate biosystems. These bio-lab-on-IC systems utilize the IC to facilitate faster, repeatable, and standardized biological experiments at low cost with a small volume of biological sample. CMOS Biotechnology will interest electrical engineers, bioengineers, biophysicists as well as researchers in MEMS, bioMEMS, microelectronics, microfluidics, and circuits and systems.

Exemplaires

Code-barres	Cote	Support	Localisation	Section	Disponibilité	Etat_Exemplaire
E00278	631.147 LEE	Ressources électroniques	Bibliothèque Centrale	Génie de l'Environnement	Disponible
E00277	631.147 LEE	Ressources électroniques	Bibliothèque Centrale	Génie de l'Environnement	Disponible

Abstraction refinement for large scale model checking / Wang, Chao

Public ISBD Titre : Abstraction refinement for large scale model checking Type de document : document électronique Auteurs : Wang, Chao, Auteur ; Hachtel, Gary D., Auteur ; Somenzi, Fabio, Auteur Editeur : Berlin : Springer Année de publication : 2006 Collection : Series on integrated circuits and systems ISBN/ISSN/EAN : 978-0-387-34600-7 Note générale : Configuration requise : Adobe acrobat Langues : Anglais (eng) Mots-clés : Engineering  Systems  engineering  Computer  engineering Résumé : Abstraction Refinement for Large Scale Model Checking summarizes recent research on abstraction techniques for model checking large digital system. Considering both the size of today's digital systems and the capacity of state-of-the-art verification algorithms, abstraction is the only viable solution for the successful application of model checking techniques to industrial-scale designs. This book describes recent research developments in automatic abstraction refinement techniques. The suite of algorithms presented in this book has demonstrated significant improvement over prior art; some of them have already been adopted by the EDA companies in their commercial/in-house verification tools. Abstraction refinement for large scale model checking [document électronique] / Wang, Chao, Auteur ; Hachtel, Gary D., Auteur ; Somenzi, Fabio, Auteur . - Springer, 2006. - (Series on integrated circuits and systems) . ISBN : 978-0-387-34600-7 Configuration requise : Adobe acrobat Langues : Anglais (eng) Mots-clés : Engineering  Systems  engineering  Computer  engineering Résumé : Abstraction Refinement for Large Scale Model Checking summarizes recent research on abstraction techniques for model checking large digital system. Considering both the size of today's digital systems and the capacity of state-of-the-art verification algorithms, abstraction is the only viable solution for the successful application of model checking techniques to industrial-scale designs. This book describes recent research developments in automatic abstraction refinement techniques. The suite of algorithms presented in this book has demonstrated significant improvement over prior art; some of them have already been adopted by the EDA companies in their commercial/in-house verification tools.

Exemplaires

Code-barres	Cote	Support	Localisation	Section	Disponibilité	Etat_Exemplaire
E00089	681.3 WAN	Ressources électroniques	Bibliothèque Centrale	Informatique	Disponible
E00090	681.3 WAN	Ressources électroniques	Bibliothèque Centrale	Informatique	Disponible