| Titre : |
Semiconductor device reliability |
| Type de document : |
texte imprimé |
| Auteurs : |
A. Christou, Éditeur scientifique ; B.A. Unger, Éditeur scientifique ; NATO Advanced Research Workshop, Éditeur scientifique |
| Editeur : |
Boston : Kluwer academic publishers |
| Année de publication : |
1990 |
| Collection : |
NATO ASI series |
| Sous-collection : |
Series E: Applied sciences num. Vol. 175 |
| Importance : |
IX-575 p. |
| Présentation : |
ill. |
| Format : |
24 cm |
| ISBN/ISSN/EAN : |
978-0-7923-0536-1 |
| Note générale : |
Proceedings of the NATO Advanced Research Workshop on Semiconductor Device Reliability, Heraklio, Crete, Greece, June 4-9, 1989.
Index |
| Langues : |
Anglais (eng) |
| Mots-clés : |
Composés semiconducteurs -- Actes de congrès
Fiabilité -- Actes de congrès |
| Index. décimale : |
621.382 Dispositifs électroniques utilisant les effets des corps solides. Dispositifs semi-conducteurs |
| Résumé : |
This publication is a compilation of papers presented at the semiconductor device reliability workshop sponsored by the NATO international scientific exchange program. The workshop was held in Crete, Greece from June 4 to Juin 9, 1989. The objective of the workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. |
| Note de contenu : |
Contents:
* Reliability Testing.
* Reliability Models and Failure Mechanisms.
* Failure Analysis.
* Opto-Electronic Reliability (I).
* Opto-Electronic Reliability (II).
* Compound Semiconductor Reliability.
* High-Speed Circuit Reliability. |
Semiconductor device reliability [texte imprimé] / A. Christou, Éditeur scientifique ; B.A. Unger, Éditeur scientifique ; NATO Advanced Research Workshop, Éditeur scientifique . - Boston : Kluwer academic publishers, 1990 . - IX-575 p. : ill. ; 24 cm. - ( NATO ASI series. Series E: Applied sciences; Vol. 175) . ISBN : 978-0-7923-0536-1 Proceedings of the NATO Advanced Research Workshop on Semiconductor Device Reliability, Heraklio, Crete, Greece, June 4-9, 1989.
Index Langues : Anglais ( eng)
| Mots-clés : |
Composés semiconducteurs -- Actes de congrès
Fiabilité -- Actes de congrès |
| Index. décimale : |
621.382 Dispositifs électroniques utilisant les effets des corps solides. Dispositifs semi-conducteurs |
| Résumé : |
This publication is a compilation of papers presented at the semiconductor device reliability workshop sponsored by the NATO international scientific exchange program. The workshop was held in Crete, Greece from June 4 to Juin 9, 1989. The objective of the workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. |
| Note de contenu : |
Contents:
* Reliability Testing.
* Reliability Models and Failure Mechanisms.
* Failure Analysis.
* Opto-Electronic Reliability (I).
* Opto-Electronic Reliability (II).
* Compound Semiconductor Reliability.
* High-Speed Circuit Reliability. |
|  |
Semiconductor device reliability (1990)
