| Titre : | Semiconductor device reliability |
| Auteurs : | A. Christou, Éditeur scientifique ; B.A. Unger, Éditeur scientifique ; NATO Advanced Research Workshop, Éditeur scientifique |
| Type de document : | texte imprimé |
| Editeur : | Boston : Kluwer academic publishers, 1990 |
| Collection : | NATO ASI series |
| Sous-collection : | Series E: Applied sciences, num. Vol. 175 |
| ISBN/ISSN/EAN : | 978-0-7923-0536-1 |
| Format : | IX-575 p. / ill. / 24 cm |
| Note générale : |
Proceedings of the NATO Advanced Research Workshop on Semiconductor Device Reliability, Heraklio, Crete, Greece, June 4-9, 1989.
Index |
| Langues : | Anglais |
| Index. décimale : | 621.382 (Dispositifs électroniques utilisant les effets des corps solides. Dispositifs semi-conducteurs ) |
| Tags : | Composés semiconducteurs -- Actes de congrès Fiabilité -- Actes de congrès |
| Résumé : | This publication is a compilation of papers presented at the semiconductor device reliability workshop sponsored by the NATO international scientific exchange program. The workshop was held in Crete, Greece from June 4 to Juin 9, 1989. The objective of the workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. |
| Note de contenu : |
Contents:
* Reliability Testing. * Reliability Models and Failure Mechanisms. * Failure Analysis. * Opto-Electronic Reliability (I). * Opto-Electronic Reliability (II). * Compound Semiconductor Reliability. * High-Speed Circuit Reliability. |
Exemplaires (1)
| Cote | Support | Localisation | Section | Disponibilité | Etat_Exemplaire |
|---|---|---|---|---|---|
| 621.382 SEM | Papier | Bibliothèque Centrale | Electronique | Disponible | En bon état |
