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Semiconductor device reliability

Public ISBD Titre : Semiconductor device reliability Type de document : texte imprimé Auteurs : A. Christou, Editeur scientifique ; B.A. Unger, Editeur scientifique ; NATO Advanced Research Workshop, Editeur scientifique Editeur : Boston : Kluwer academic publishers Année de publication : 1990 Collection : NATO ASI series Sous-collection : Series E: Applied sciences num. Vol. 175 Importance : IX-575 p. Présentation : ill. Format : 24 cm ISBN/ISSN/EAN : 978-0-7923-0536-1 Note générale : Proceedings of the NATO Advanced Research Workshop on Semiconductor Device Reliability, Heraklio, Crete, Greece, June 4-9, 1989. Index Langues : Anglais (eng) Mots-clés : Composés  semiconducteurs  --  Actes  de  congrès Fiabilité  --  Actes  de  congrès Index. décimale : 621.382 Dispositifs électroniques utilisant les effets des corps solides. Dispositifs semi-conducteurs Résumé : This publication is a compilation of papers presented at the semiconductor device reliability workshop sponsored by the NATO international scientific exchange program. The workshop was held in Crete, Greece from June 4 to Juin 9, 1989. The objective of the workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. Note de contenu : Contents: * Reliability Testing. * Reliability Models and Failure Mechanisms. * Failure Analysis. * Opto-Electronic Reliability (I). * Opto-Electronic Reliability (II). * Compound Semiconductor Reliability. * High-Speed Circuit Reliability. Semiconductor device reliability [texte imprimé] / A. Christou, Editeur scientifique ; B.A. Unger, Editeur scientifique ; NATO Advanced Research Workshop, Editeur scientifique . - Kluwer academic publishers, 1990 . - IX-575 p. : ill. ; 24 cm. - (NATO ASI series. Series E: Applied sciences; Vol. 175) . ISBN : 978-0-7923-0536-1 Proceedings of the NATO Advanced Research Workshop on Semiconductor Device Reliability, Heraklio, Crete, Greece, June 4-9, 1989. Index Langues : Anglais (eng) Mots-clés : Composés  semiconducteurs  --  Actes  de  congrès Fiabilité  --  Actes  de  congrès Index. décimale : 621.382 Dispositifs électroniques utilisant les effets des corps solides. Dispositifs semi-conducteurs Résumé : This publication is a compilation of papers presented at the semiconductor device reliability workshop sponsored by the NATO international scientific exchange program. The workshop was held in Crete, Greece from June 4 to Juin 9, 1989. The objective of the workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. Note de contenu : Contents: * Reliability Testing. * Reliability Models and Failure Mechanisms. * Failure Analysis. * Opto-Electronic Reliability (I). * Opto-Electronic Reliability (II). * Compound Semiconductor Reliability. * High-Speed Circuit Reliability.

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Code-barres	Cote	Support	Localisation	Section	Disponibilité	Etat_Exemplaire
041568	621.382 SEM	Papier	Bibliothèque Centrale	Electronique	Disponible	En bon état